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Syllabus
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Introduction 1 min
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EEPROM Memory Cells 3 min
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Flash Memory Cells 1 min
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Memory Cell Wear and Failure 2 min
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Write Reduction 2 min
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Write Caching 3 min
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Wear Leveling 5 min
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Error Mitigation 7 min
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Summary 1 min
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Strategies for Nonvolatile Memory Reliability
This class covers how EEPROM and NOR Flash memory operate, wear out, and fail, as well as several strategies for maximizing performance and reliability of memory devices in applications. (Sept 2021)
This class will explain how EEPROM and NOR Flash memory operate, wear out, and fail, several effective strategies for reducing wear, as well as detecting and responding to failures. Techniques explained include write reduction, write caching, wear leveling, error detection, and error correction. Familiarity with these techniques will enable you to maximize the performance and reliability of your applications.